2026-10-12
An epitaxy process engineer notices a pattern in the defect maps. The same susceptor model from the same supplier produces different results in two fabs. In Fab A, the particle count on the wafer is below 10 per wafer. In Fab B, it is above 50 per wafer. The process recipes are identical. The gas flows are identical. The temperature profiles are identical. The difference is the susceptor handling and storage. The Fab B team stores the susceptors in an open cabinet near the service corridor. The Fab A team stores them in a nitrogen-purged cabinet inside the cleanroom. The Si Epitaxy process is sensitive to particles at the nanoscale. A single particle on the susceptor surface can create a stacking fault that renders the device useless. This guide explains why ultra-clean manufacturing is not a luxury in susceptor production. It is a functional requirement.
The critical particle size for Si Epitaxy is not the same as for general semiconductor manufacturing. The epitaxial layer thickness for power devices ranges from 5 to 20 microns. A particle that is larger than the layer thickness will create a defect that propagates through the layer. A particle that is smaller than the layer thickness may be buried, but it can still cause a dislocation that affects the electrical properties. The industry standard for susceptor surface cleanliness is less than 10 particles per square centimeter that are larger than 0.3 microns. For advanced devices, the requirement is less than 5 particles per square centimeter larger than 0.2 microns. The table below shows the particle size limits for different Si Epitaxy applications.
| Application | Epitaxial layer thickness | Critical particle size | Maximum particle count |
| Power MOSFET | 5 – 10 µm | > 0.5 µm | < 10 per cm² |
| IGBT | 10 – 20 µm | > 0.3 µm | < 5 per cm² |
| RF device | 1 – 3 µm | > 0.2 µm | < 3 per cm² |
| Advanced logic | 0.5 – 1 µm | > 0.1 µm | < 1 per cm² |
In our factory, we measure the surface particle count on every susceptor using a laser particle counter. The measurement is performed in a Class 100 cleanroom. The susceptor is scanned at 10 locations, and the average count is reported. Semicorex Advanced Material Technology Co.,Ltd. has been producing Si Epitaxy susceptors for over 10 years and has maintained a particle count below 5 per cm² for the last five years.
Particle contamination can originate from four sources. The first is the raw material. The graphite substrate must have a low ash content and a uniform pore structure. If the graphite contains metallic impurities, these impurities can vaporize during Si Epitaxy and deposit on the wafer. The second is the machining process. The CNC machining of the graphite creates dust and debris. If the dust is not removed, it becomes embedded in the surface. The third is the coating process. The CVD SiC coating is deposited in a reactor. If the reactor is not clean, particles from the reactor walls can fall onto the susceptor. The fourth is the handling and packaging. Every time the susceptor is touched, there is a risk of transferring particles from gloves, tools, or the environment. The table below shows the contribution of each source to the final particle count.
| Contamination source | Typical contribution | Control method |
| Raw graphite material | 10 – 15% | Supplier qualification; ash content < 50 ppm |
| CNC machining | 20 – 30% | Wet machining; ultrasonic cleaning after machining |
| CVD coating reactor | 30 – 40% | Reactor cleaning between runs; particle monitor |
| Handling and packaging | 20 – 30% | Cleanroom gloves; nitrogen purge; vacuum packaging |
The CVD coating reactor is the largest contributor because the coating process deposits material on the reactor walls as well as on the susceptor. If the reactor is not cleaned between runs, the wall deposits can flake off and fall onto the susceptor. In our factory, we clean the reactor after every run using a fluorine-based etchant. We also monitor the particle count in the reactor exhaust. Semicorex Advanced Material Technology Co.,Ltd. has developed a proprietary reactor cleaning cycle that reduces the particle contribution from the coating process to less than 10 percent.
The cleanroom classification determines the background particle level. A Class 1000 cleanroom has 1,000 particles per cubic foot that are larger than 0.5 microns. A Class 100 cleanroom has 100 particles per cubic foot. A Class 10 cleanroom has 10 particles per cubic foot. For Si Epitaxy susceptor production, the critical operations—coating, inspection, and packaging—should be performed in a Class 100 or better environment. The table below shows the cleanroom classification and its suitability for different production steps.
| Production step | Minimum cleanroom class | Typical particle count | Critical control |
| Graphite machining | Class 10,000 | < 10,000 per ft³ | Wet cutting; local exhaust |
| Pre-coating cleaning | Class 1,000 | < 1,000 per ft³ | Ultrasonic bath; DI water rinse |
| CVD coating | Class 100 | < 100 per ft³ | Reactor cleaning; loadlock purge |
| Final inspection | Class 100 | < 100 per ft³ | Laser particle counter; gloves |
| Packaging | Class 100 | < 100 per ft³ | Nitrogen purge; vacuum seal |
Cleanroom tip: The cleanroom class is not the only factor. The airflow pattern, the garment protocol, and the equipment cleanliness also matter. A Class 100 cleanroom with poor airflow can have localized particle counts that are higher than a Class 1,000 cleanroom with good airflow. In our factory, we use a unidirectional airflow hood over the inspection and packaging stations. The air velocity is maintained at 0.45 m/s. Semicorex Advanced Material Technology Co.,Ltd. monitors the particle count at 12 locations in the cleanroom every shift.
Even a susceptor that is manufactured in a Class 100 cleanroom can become contaminated during packaging and transport. The packaging material must be cleanroom-compatible. Standard cardboard boxes and foam inserts are not acceptable because they shed particles. The packaging should use cleanroom-grade polyethylene bags, nitrogen purge, and a rigid outer container. The table below shows the packaging requirements for Si Epitaxy susceptors.
| Packaging component | Requirement | Reason |
| Inner bag | Cleanroom-grade PE, double bagged | Prevents particle migration |
| Nitrogen purge | 99.999% N₂, 5 minute purge | Prevents oxidation and moisture |
| Outer container | Rigid plastic or metal | Protects against impact |
| Cushioning | Cleanroom foam or bubble wrap | Prevents movement during transport |
| Labeling | Particle-free label | Prevents adhesive residue |
In our factory, we package every Si Epitaxy susceptor in a Class 100 cleanroom. The susceptor is placed in a cleanroom bag, purged with nitrogen, and sealed. The bag is then placed in a second bag and sealed again. The double-bagged susceptor is placed in a rigid container with cleanroom foam. We also include a particle count certificate in the package. Semicorex Advanced Material Technology Co.,Ltd. has validated this packaging method with a 10,000 km transport test. The particle count on the susceptor after transport was less than 5 per cm².
Ultra-clean manufacturing is essential for Si Epitaxy susceptor production because the process is sensitive to particles at the sub-micron level. The critical particle size is 0.3 microns or smaller, and the maximum allowable count is 5 to 10 particles per square centimeter. The contamination sources include raw material, machining, coating, and handling. The cleanroom classification, airflow pattern, and packaging protocol all contribute to the final cleanliness. By controlling these factors, manufacturers can produce susceptors that meet the stringent requirements of advanced Si Epitaxy processes. Semicorex Advanced Material Technology Co.,Ltd. has been producing ultra-clean Si Epitaxy susceptors for over 10 years and provides full particle count documentation for our products.
Semicorex Advanced Material Technology Co.,Ltd. manufactures Si Epitaxy susceptors in a Class 100 cleanroom with semiconductor-grade graphite, CVD SiC coating, and nitrogen-purged double-bag packaging. We provide particle count certificates and impurity analysis for all of our products.